SCI论文写作之Experimental section(一)

    Experimental section是SCI论文写作中最简单的一个部分，不过也挺有意思的，它有意无意之间可能会反映作者的心态与素养。今天先从简单的开始吧，给大家总结下Experimental Section里面仪器表征部分的一些写法，大家应该用得上，不过不建议大家直接用哈，最好稍微有点变动。

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基本介绍

    Experimental section里面的仪器表征部分（Characterizations）主要是跟读者交代本文所采用的是哪种仪器，使用的什么条件，有什么值得注意的问题等等。不过，每个人严谨的程度不一样，文中所给出的信息的全面程度也会不一样。在这里，还是建议大家尽可能写得细致一点,。今天给大家分享一些General的写法。

以下内容蓝色部分可以作为模板

1. XRD：

理论上应该给出以下信息：仪器型号，工作电压和电流，靶材，步长等。

A. Grazing incidence X-ray diffraction (GIXRD) patterns were recorded on a Phillips X’Pert Panalytical diffractometer operating at 40 mA and 45 kV using monochromated Cu Kα1 radiation (incident angle = 0.5°, λ = 1.541Å, step size= 0.5°, integration time 20 s/step).（Ref.: J. Am. Chem. Soc. 2012, 134, 17253−17261）

B. Wide-angle XRD patterns were recorded on a Rigaku Ultimate IV diffractometer using Cu Kα radiation (40 kV, 40 mA, 10° min−1 from 10 to 80°). （Ref.:J. Phys. Chem. C 2017, 121, 4343−4351）

当然，你真要写得简略点，审稿人也不太会计较

C. Powder X-ray diffraction (XRD) measurements were recorded on a Rigaku D/MAX-RB diffractometer with monochromatized Cu Kα radiation (λ = 0.15418 nm).

2. XPS

理论上应该给出：仪器型号，X射线源，荷电校正的标准等等

A. X-ray photoelectron spectroscopy (XPS) studies were carried out on an ESCALAB 250 (ThermoScientific) using an Al Kα monochromated (150 W, 20 eV pass energy, 500 μm spot size) or a Mg Kα nonmonochromated flood (400 W, 75 eV pass energy) source. The samples were charge-neutralized using an in-lens electron source combined with a low-energy Ar+ flood source. Spectra were analyzed using ThermoScientific Avantage 4.75 software. The Au 4f7/2 signal at 84.0 eV was used to calibrate the binding energy scale.（Ref.: J. Am. Chem. Soc. 2012, 134, 17253−17261）

B. X-ray photoelectron spectra were recorded on a VG EscaLab 220i spectrometer, using a standard Al Kα X-ray source (300W) and an analyser pass energy of 20 eV. Samples were mounted using double-sided adhesive tape and binding energies are referenced to the C(1s) binding energy of adventitious carbon contamination taken to be 284.7eV.

C. XPS measurements were performed on a VG Scientific ESCALAB Mark II spectrometer equipped with two ultrahigh vacuum (UHV) chambers. All binding energies were referenced to the C 1s peak at 284.8 eV of the surface adventitious carbon to correct the shift caused by charge effect. （Ref.:J. Phys. Chem. C 2017, 121, 4343−4351）

3. SEM和TEM

理论上应该给出：仪器型号，工作电压，样品制备细节等等

A. SEM images were collected on a Zeiss Ultra 55 SEM at 5 kV. Samples for SEM imaging were deposited on Si wafers.（Ref.: J. Am. Chem. Soc. 2012, 134, 17253−17261）

B. TEM, HRTEM and EDX mapping were recorded on the FEI TITAN Cs-corrected ChemiSTEM equipped with an energy dispersive X-ray (EDX) spectroscope, operating at 200 kV. The sample was embedded in epoxy resin, and then microtomed into sub-100 nm ultrathin films at room temperature. These microtomed thin film samples were first dispersed in deionized water and then deposited onto a carbon-coated copper grid for HAADF-STEM imaging and EDX mapping. (J. Phys. Chem. C, 2017, 121, 4074–4082)

C. Samples of all catalysts were prepared for scanning transmission electron microscopy examination by dispersing the catalyst powder in ultra high purity ethanol. A drop of the suspension was then allowed to evaporate on a holeycarbon film supported by a 300 mesh copper TEM grid. Samples were subjected to chemical microanalysis and annular dark-field imaging in a VG systems HB603 STEM operating at 300 kV. This instrument was fitted with a Nion aberration corrector and an Oxford Instruments INCA TEM 300 system for energy dispersive X-ray (XEDS) analysis. (Science 2006, 311, 10)

4. 紫外可见漫反射光谱

UV-vis相对而言要说明的要少一些：仪器型号，基底材料等

A. A Varian Cary 100 Scan UV-visible system equipped with a Labsphere diffuse reflectance accessory was used to obtain the reflectance spectra of the catalysts over the range of 200-800 nm. Laboratory sphere USRS-99-010 was employed as the reflectance standard. (J. Phys. Chem. C 2011, 115, 20555–20564)

B. Room temperature UV−vis absorption spectroscopy was conducted on a Perkin-Elmer Lambda 950 UV−vis−NIR spectrophotometer using an integrating-sphere accessory. (J. Am. Chem. Soc. 2013, 135, 10411−10417)

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